Materials Characterization
The Materials Characterization Core facility is located in Room 006 of 245 Beacon Street on the main campus of Boston College. The facility supports multiple characterization needs, including surface analysis, optical analysis, thermal analysis, structure/phase analysis, mechanical analysis, absorption analysis, and so on.听 As a new core facility, we are also expecting to further develop the functions according to the users' needs.
Bruker D2 Phaser Powder X-ray Diffractometer (PXRD)
Structure Analysis
Phase Analysis
This benchtop device is used for quantitative phase analysis and crystal structure identification of a crystalline material. Nano-structure and crystallite size can be determined through small-angle x-ray scattering (SAXS) analysis.
ThermoFisher K-Alpha X-ray Photoelectron Spectroscopy (XPS)
Surface Analysis
The K-Alpha Spectrometer delivers much improved spectroscopic performance. This leap forward results in faster analysis times, improved element detection, and the possibility to acquire data at higher resolution yielding better chemical state identification.
Analytical options include a vacuum transfer module for moving air-sensitive samples from a glove box to the system, and the tilt module for ARXPS data collection. Equipped with the听Thermo Scientific鈩� Avantage Data System, the complete surface analysis software system, the K-Alpha has a range of software features designed to optimize data interpretation, data reporting and usability. The K-Alpha XPS system meets the requirements of both experienced XPS analysts and newcomers to the technique, bringing together high performance, monochromated XPS and sputter depth profiling, with intelligent automation and intuitive control.
Park XE70 Atomic Force Microscopy (AFM)听aka scanning force microscopy (SFM)
Surface Analysis
It commonly provides ultra high resolution topographical surface characterization. The image is obtained by the tip tapping on the surface of the sample. Therefore, it also available to study the electrical, magnetic, and mechanical properties of surfaces.听
Horiba Micro XploRA Raman Spectrometer
Optical Analysis
Structure Analysis
It is a non-destructive fingerprint chemical analysis technique which provides detailed information about chemical structure, phase and polymorphism, intrinsic stress/strain, crystallinity and molecular interactions. The measurement is based upon the interaction of light with the chemical bonds within a material.